A general model of 1/fγ noise

被引：11

作者：

Pellegrini, B ^{[1
]}

机构：

[1] Univ Pisa, Dipartimento Ingn Informaz Elettron Informat & Te, CSMDR, CNR, I-56126 Pisa, Italy

来源：

MICROELECTRONICS RELIABILITY | 2000年 / 40卷 / 11期

关键词：

D O I：

10.1016/S0026-2714(00)00061-5

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A model of 1/f(gamma) noise is proposed that accounts for all its experimental properties. Its origin is found to be in the charge fluctuations in few defects, even less than 100, with relaxation times tau arbitrarily distributed in a wide interval, up to large values. The coupling coefficient between local and output fluctuations, the dependence of the defect occupation factor on tau, the frequency exponent gamma and the coefficient alpha of the spectrum are computed in a general and simple way. Published by Elsevier Science Ltd.

引用

页码：1775 / 1780

页数：6

共 9 条

[1] PHOTOCURRENT TRANSIENTS IN ALMOST IDEAL SILICON P-N-JUNCTIONS [J].

BASSO, G ;

PELLEGRINI, B .

JOURNAL OF APPLIED PHYSICS, 1995, 78 (04) :2504-2508

[2]

BISHOP J, 1983, THESIS U EINDHOVEN, P82

[3] MICROCYCLE SPECTRAL ESTIMATES OF 1-F NOISE IN SEMICONDUCTORS [J].

CALOYANNIDES, MA .

JOURNAL OF APPLIED PHYSICS, 1974, 45 (01) :307-316

[4] The Schottky effect in low frequency circuits [J].

Johnson, JB .

PHYSICAL REVIEW, 1925, 26 (01) :0071-0085

[5] NOISE IN SEMICONDUCTORS - SPECTRUM OF A 2-PARAMETER RANDOM SIGNAL [J].

MACHLUP, S .

JOURNAL OF APPLIED PHYSICS, 1954, 25 (03) :341-343

[6]

MCWORTER AL, 1955, 80 MIT LINC LAB

[7] ELECTRIC CHARGE MOTION, INDUCED CURRENT, ENERGY-BALANCE, AND NOISE [J].

PELLEGRINI, B .

PHYSICAL REVIEW B, 1986, 34 (08) :5921-5924

[8] EXTENSION OF THE ELECTROKINEMATICS THEOREM TO THE ELECTROMAGNETIC-FIELD AND QUANTUM-MECHANICS [J].

PELLEGRINI, B .

NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA D-CONDENSED MATTER ATOMIC MOLECULAR AND CHEMICAL PHYSICS FLUIDS PLASMAS BIOPHYSICS, 1993, 15 (06) :855-879

[9] 1/F-GAMMA NOISE FROM SINGLE-ENERGY-LEVEL DEFECTS [J].

PELLEGRINI, B .

PHYSICAL REVIEW B, 1987, 35 (02) :571-580

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