Phosphonate-anchored thin films on titanium and niobium oxide surfaces: Fabrication and characterization

被引：8

作者：

Adadi, Racheli ^{[1
,2
]}

Zorn, Gilad ^{[3
]}

Brener, Reuven ^{[4
]}

Gotman, Irena ^{[3
]}

Gutmanas, Elazar Y. ^{[3
]}

Sukenik, Chaim N. ^{[1
,2
]}

机构：

[1] Bar Ilan Univ, Bar Ilan Inst Nanotechnol & Adv Mat, Dept Chem, IL-52900 Ramat Gan, Israel

[2] Bar Ilan Univ, Bar Ilan Inst Nanotechnol & Adv Mat, Nanomat Res Ctr, IL-52900 Ramat Gan, Israel

[3] Technion Israel Inst Technol, Fac Mat Engn, IL-32000 Haifa, Israel

[4] Technion Israel Inst Technol, Inst Solid State, IL-32000 Haifa, Israel

来源：

THIN SOLID FILMS | 2010年 / 518卷 / 08期

关键词：

Phosphonate-anchored thin films; Atomic Force Microscopy; X-ray Photoelectron Spectroscopy; Fourier Transform Infra Red Spectroscopy; SELF-ASSEMBLED MONOLAYERS; ALKYLPHOSPHONIC ACID; TI45NB ALLOY; SILOXANE;

D O I：

10.1016/j.tsf.2009.07.038

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Phosphonate-anchored thin films form on various metal oxide substrates. This paper compares structural details of these covalently anchored films on the oxidized surfaces of titanium, niobium and a Ti45Nb alloy. This is made possible by a sample configuration wherein the alkylphosphonates are coated onto a thin film of metal which is sputtered onto a double-side-polished silicon wafer and then oxidized. Samples are flat and reflective and are suitable for ellipsometry, wetting measurements, X-ray Photoelectron Spectroscopy, Atomic Force Microscopy, and Fourier Transform Infrared-Attenuated Total Reflectance Spectroscopy. Deposition from heated tetrahydrofuran produces ordered films with measurable differences among deposition protocols and among metal oxide substrates. These substrates enable identification of the mildest deposition procedures that still Provide uniform, robust surface coatings. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：1966 / 1972

页数：7

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