Measuring relatedness between technological fields

被引:57
作者
Joo, Si Hyung [1 ]
Kim, Yeonbae [1 ]
机构
[1] Seoul Natl Univ, Sch Engn, Technol Management Econ & Policy Program, Seoul 151742, South Korea
关键词
Relatedness; IPC co-occurrence; Incomplete multi-dimensional contingency table; Mantel-Haenszel common odds ratio; CO-CLASSIFICATION ANALYSIS; PATENT STATISTICS; SCIENCE; INDICATORS; COHERENCE; MATRICES;
D O I
10.1007/s11192-009-0108-9
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
Intensified technology convergence, increasing relatedness between technological fields, is a mega-trend in 21st century science and technology. However, scientometrics has been unsuccessful in identifying this techno-economic paradigm change. To address the limitations and validity problems of conventional measures of technology convergence, we introduce a multi-dimensional contingency table representation of technological field co-occurrence and a relatedness measure based on the Mantel-Haenszel common log odds ratio. We used Korean patent data to compare previous and proposed methods. Results show that the proposed method can increase understanding of the techno-economic paradigm change because it reveals significant changes in technological relatedness over time.
引用
收藏
页码:435 / 454
页数:20
相关论文
共 50 条
[1]  
ACS ZJ, 1989, KYKLOS, V42, P171
[2]  
Agresti A, 2013, Categorical data analysis, V3rd
[3]  
[Anonymous], WORLD PAT REP STAT R
[4]  
[Anonymous], 1971, Journal of Mathematical Sociology, DOI 10.1080/0022250X.1971.9989788
[5]  
[Anonymous], 2003, Converging Technologies for Improving Human Performance: Nanotechnology, Biotechnology, Information Technology and Cognitive Science
[6]   Knowledge-relatedness in firm technological diversification [J].
Breschi, S ;
Lissoni, F ;
Malerba, F .
RESEARCH POLICY, 2003, 32 (01) :69-87
[7]   SOME METHODS FOR STRENGTHENING THE COMMON X2 TESTS [J].
COCHRAN, WG .
BIOMETRICS, 1954, 10 (04) :417-451
[8]  
COCKBURN IM, 2002, 8089 NBER
[9]  
CRISCUOLO P, 2005, 0506 EINDH CTR INN S
[10]   Trade in ideas - Patenting and productivity in the OECD [J].
Eaton, J ;
Kortum, S .
JOURNAL OF INTERNATIONAL ECONOMICS, 1996, 40 (3-4) :251-278