Characterization of normal and inverted interfaces by the Zeeman effect in Cd1-xMnxTe/CdTe/Cd1-yMgyTe quantum wells

被引：12

作者：

Lemaitre, A

Testelin, C

Rigaux, C

Mackowski, S

Khoi, NT

Gaj, JA

Karczewski, G

Wojtowicz, T

Kossut, J

机构：

[1] Univ Paris 06&7, Phys Solides Grp, F-75231 Paris 05, France

[2] Univ Warsaw, Inst Expt Phys, PL-00681 Warsaw, Poland

[3] Polish Acad Sci, Inst Phys, Warsaw, Poland

来源：

PHYSICAL REVIEW B | 1998年 / 57卷 / 08期

关键词：

D O I：

10.1103/PhysRevB.57.4708

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We present a study of che interface profile in asymmetric Cd1-xMnxTe/CdTe/Cd1-yMgyTe quantum wells, with normal (Cd1-xMnxTe on CdTe) and inverted (CdTe on Cd1-xMnxTe) interfaces, The Zeeman spectra of the confined exciton states were determined by magnetoreflectivity and Kerr rotation measurements. Using a segregation model and an asymmetric exponential profile, we interpret the Zeeman spectra of quantum wells, and determine the interface widths. For the same concentrations of Mn in the barriers and the same growth conditions, the results can be coherently explained assuming an interface width independent of the quantum-well width and the type of interface (normal or inverted). [S0163-1829(98)04607-4].

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收藏

页码：4708 / 4712

页数：5

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