Evidence for density anomalies of liquids at the solid/liquid interface

被引:46
作者
Doerr, AK [1 ]
Tolan, M [1 ]
Schlomka, JP [1 ]
Press, W [1 ]
机构
[1] Univ Kiel, Inst Expt & Angew Phys, D-24098 Kiel, Germany
来源
EUROPHYSICS LETTERS | 2000年 / 52卷 / 03期
关键词
D O I
10.1209/epl/i2000-00443-7
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We show that the density of liquids is altered significantly next to a hard wall. Thin films of van der Waals liquids on silicon substrates have been prepared and investigated by means of X-ray reflectivity. This probe yields density profiles on an angstrom scale. The region next to the substrates is highly sensitive to the shape of the molecules of the liquid. Our results are in agreement with published density functional calculations. Small, almost spherical molecules exhibit a one-dimensional ordering perpendicular to the surface while more complex molecules lead to a low-density region in the vicinity of the substrate.
引用
收藏
页码:330 / 336
页数:7
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