Experimental determination of thermal and electrical properties of Ni-Ti shape memory wires

被引:90
作者
Faulkner, MG [1 ]
Amalraj, JJ [1 ]
Bhattacharyya, A [1 ]
机构
[1] Univ Alberta, Dept Mech Engn, Edmonton, AB T6G 2G8, Canada
关键词
D O I
10.1088/0964-1726/9/5/307
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The thermal and electrical properties of shape memory alloys (SMA) are known to be different in their austenitic and martensitic phases. This paper addresses the determination of the phase-dependent heat capacity, thermal conductivity and electrical resistivity of a SMA wire. While the heat capacity measurements are relatively straightforward using a differential scanning calorimeter, the determination of the thermal conductivity and the electrical resistivity are more difficult in view of the possible non-uniformity in the material state of a SMA wire during a phase transformation. Experimental procedures are developed and used to determine these properties in either phase and, along with a previously developed finite-element code accounting for the non-uniform material states, the austenite and martensite properties are determined from the experimental data. For the SMA wire tested, the thermal conductivities of the austenite and martensite phases are determined to be 2.8 x 10(-2) J (mm S K)(-1) and 1.4 x 10(-2) J (mm S K)(-1) respectively, a difference of 100%. The electrical resistivities of the austenite and martensite phases are determined to be 8.371 x 10(-4) Omega mm and 9.603 x 10(-4) Omega mm respectively, a difference of about 14.7%.
引用
收藏
页码:632 / 639
页数:8
相关论文
共 8 条
[1]   Finite-element modeling of phase transformation in shape memory alloy wires with variable material properties [J].
Amalraj, JJ ;
Bhattacharyya, A ;
Faulkner, MG .
SMART MATERIALS & STRUCTURES, 2000, 9 (05) :622-631
[2]   Finite element modeling of cyclic thermal response of shape memory alloy wires with variable material properties [J].
Bhattacharyya, A ;
Faulkner, MG ;
Amalraj, JJ .
COMPUTATIONAL MATERIALS SCIENCE, 2000, 17 (01) :93-104
[3]  
*DYN INC, 1998, INSTR FLEXINOL SAMPL
[4]  
FUNAKABO H, 1984, SHAPE MEMORY ALLOYS
[5]  
JACKSON CM, 1972, NASA SP, V5110
[6]  
LAGOUDAS DC, 1996, P SOC PHOTO-OPT INS, V2175, P482
[7]  
*OM INC, 1992, OMEGALUX COMPL EL HE, V28, pZ30
[8]  
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