Charge-state resolved above threshold ionization

被引：54

作者：

Witzel, B ^{[1
]}

Papadogiannis, NA ^{[1
]}

Charalambidis, D ^{[1
]}

机构：

[1] Fdn Res & Technol Hellas, Inst Elect Struct & Laser, Laser & Applicat Div, Iraklion 71110, Crete, Greece

来源：

PHYSICAL REVIEW LETTERS | 2000年 / 85卷 / 11期

关键词：

D O I：

10.1103/PhysRevLett.85.2268

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Photoelectron energy resolved spectra recorded in coincidence with singly and doubly ionized atoms are reported for the interaction of xenon with 60 fs laser pulses at 800 nm and 1 x 10(14) W/cm(2). Double ionization contributions in the spectrum have been established. The appearance of a single ionization plateau in above threshold ionization is verified. A hotter electron distribution is found for the double ionization.

引用

页码：2268 / 2271

页数：4

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