Ferroelectric size effects in multiferroic BiFeO3 thin films

被引:173
作者
Chu, Y. H. [1 ]
Zhao, T.
Cruz, M. P.
Zhan, Q.
Yang, P. L.
Martin, L. W.
Huijben, M.
Yang, C. H.
Zavaliche, F.
Zheng, H.
Ramesh, R.
机构
[1] Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA
[2] Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA
关键词
D O I
10.1063/1.2750524
中图分类号
O59 [应用物理学];
学科分类号
摘要
Ferroelectric size effects in multiferroic BiFeO3 have been studied using a host of complementary measurements. The structure of such epitaxial films has been investigated using atomic force microscopy, transmission electron microscopy, and x-ray diffraction. The crystal structure of the films has been identified as a monoclinic phase, which suggests that the polarization direction is close to [111]. Such behavior has also been confirmed by piezoforce microscopy measurements. That also reveals that the ferroelectricity is down to at least 2 nm. (c) 2007 American Institute of Physics.
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页数:3
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