Blind deconvolution of spotted image based on slice selection of third-order moment

被引：1

作者：

Lu, WK ^{[1
]}

Gai, R ^{[1
]}

机构：

[1] Tsing Hua Univ, Dept Automat, Inst Informat Proc, Key State Lab Intelligent Technol & Syst, Beijing 10084, Peoples R China

来源：

ELECTRONICS LETTERS | 2003年 / 39卷 / 05期

关键词：

D O I：

10.1049/el:20030294

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The 1D blind deconvolution algorithm using maximum time delay slice of the third-order moment ((MTDS-TOM)[Lu, W]) is extended to 2D blind deconvolution for spotted image deblurring. A scaled and shifted version of the image is obtained using a special slice selected from its third-order moment, which is estimated using a 4D blind deconvolution. An application of the proposed method for removing the optical blur of a microarray image is given.

引用

页码：425 / 426

页数：2