共 4 条
[1]
BAGRAEV NT, 1993, DEFECT DIFFUS FORUM, V103, P201
[2]
BAGRAEV NT, 1996, P ICPS 23 SING WORLD, P1241
[3]
WEAK LOCALIZATION IN THIN-FILMS - A TIME-OF-FLIGHT EXPERIMENT WITH CONDUCTION ELECTRONS
[J].
PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS,
1984, 107 (01)
:1-58
[4]
Shallow and deep centers in heavily doped silicon quantum wells
[J].
ICDS-18 - PROCEEDINGS OF THE 18TH INTERNATIONAL CONFERENCE ON DEFECTS IN SEMICONDUCTORS, PTS 1-4,
1995, 196-
:467-471