Parameters influencing the existence and the observability of etched tracks: Application to alpha particle detection in CR-39

被引:16
作者
Meyer, P [1 ]
Jouffroy, M [1 ]
Membrey, F [1 ]
Fromm, M [1 ]
Chambaudet, A [1 ]
机构
[1] UFR Sci & Tech, Lab Microanal Nucl, F-25030 Besancon, France
关键词
D O I
10.1093/oxfordjournals.rpd.a032184
中图分类号
X [环境科学、安全科学];
学科分类号
08 ; 0830 ;
摘要
In the various applications (particularly in the field of neutron dosimetry) where Solid State Nuclear Tracks Detectors (SSNTD) are used, the registration characteristics of the type of SSNTD used must be established in order to obtain information about the real number of ionising particles that were slowed down in the detector's material. The chemical etching of alpha particle tracks has been studied in CR-39 SSNTDs based on two etching velocities. These two velocities have been compared in order to find the condition for the etched track's existence during the etching process. This comparison leads to defining the delayed time, t(d), which is the time between the beginning of the etching process and the etched track's existence. This time has been introduced into our etching model and the experimental and calculated critical angles have thus been compared.
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页码:75 / 83
页数:9
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