Polarization contrast with an apertureless near-field optical microscope

被引:15
作者
Adam, PM [1 ]
Royer, P [1 ]
Laddada, R [1 ]
Bijeon, JL [1 ]
机构
[1] Univ Technol Troyes, Lab Nanotechnol & Instrumentat Opt, F-10010 Troyes, France
关键词
SNOM; near-field optics; scanning probe microscopy; polarization;
D O I
10.1016/S0304-3991(97)00091-0
中图分类号
TH742 [显微镜];
学科分类号
摘要
We report on an apertureless scanning near-field optical microscope operating in reflection mode and based on a commercial AFM. We discuss the optical origin of the near-field images of a test sample. We show that the optical images have a sharp contrast depending on the stale of polarization of the incident light. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:327 / 331
页数:5
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