Epitaxial structures of self-organized, standing-up pentacene thin films studied by LEEM and STM

被引：29

作者：

Al-Mahboob, A. ^{[1
]}

Sadowski, J. T. ^{[1
]}

Nishihara, T. ^{[1
]}

Fujikawa, Y. ^{[1
]}

Xue, Q. K. ^{[1
]}

Nakajima, K. ^{[1
]}

Sakurai, T. ^{[1
]}

机构：

[1] Tohoku Gakuin Univ, Mat Res Inst, Aoba Ku, Sendai, Miyagi 9808577, Japan

来源：

SURFACE SCIENCE | 2007年 / 601卷 / 05期

关键词：

low-energy electron microscopy (LEEM); low-energy electron diffraction (LEED); scanning tunneling microscopy; epitaxy; self-assembly; pentacene;

D O I：

10.1016/j.susc.2006.12.064

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Growth of pentacene (Pn) thin films has been studied ill situ by means of low-energy electron microscopy (LEEM) and scanning tunneling microscopy (STM). A very low nucleation density of Pn grains has been observed on Bi(0001)/Si(111) template, resulting in formation of large, monolayer-high Pn grains with diameter exceeding several hundreds of micrometers. We determined that formation of self-organized, standing-up Pit epitaxial layers was stabilized by a weak interaction between the substrate and Pn molecules and by the presence of the commensurate structure between the oblique Pn lattice and trigonal substrate surface lattice. The 'point-on-line' commensurability has been found along a-axis of Pn and one of the primitive vectors of substrate surface lattice. Strong 'point-on-line' commensurability in Pn/Bi(0001)/Si(111) system resulted in a bulk-like epitaxial thin film growth, starting from the first layer. The presence of twins, often having a mirror line parallel to the direction of the 'point-on-line' matching, has been also detected using an asymmetric dark-field imaging mode in LEEM experiments, which, we believe, is the first LEEM demonstration of molecular tilt imaging. (c) 2006 Elsevier B.V. All rights reserved.

引用

页码：1304 / 1310

页数：7

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