Dopant density determination in disordered organic field-effect transistors

We demonstrate that, by using a concentric device geometry, the dopant density and the bulk charge-carrier mobility can simultaneously be estimated from the transfer characteristics of a single disordered organic transistor. The technique has been applied to determine the relation between the mobility and the charge density in solution-processed poly(2,5-thienylene vinylene) and poly(3-hexyl thiophene) thin-film field-effect transistors. The observation that doping due to air exposure takes place already in the dark, demonstrates that photoinduced oxygen doping is not the complete picture. (C) 2003 American Institute of Physics.