Third-order nonlinear optical properties of thin sputtered gold films

被引：56

作者：

Xenogiannopoulou, E.

Aloukos, P.

Couris, S. ^{[1
]}

Kaminska, E.

Piotrowska, A.

Dynowska, E.

机构：

[1] Univ Patras, Dept Phys, Patras 26500, Greece

[2] Fdn Res & Technol Hellas, FORTH, Inst Chem Engn & High Temp Chem Proc, ICEHT, Patras 26504, Greece

[3] Inst Electr Mat Technol, Warsaw, Poland

[4] Polish Acad Sci, Inst Phys, Warsaw, Poland

来源：

OPTICS COMMUNICATIONS | 2007年 / 275卷 / 01期

关键词：

Au films; third-order susceptibility; nonlinear optical properties; optical Kerr effect; Z-scan;

D O I：

10.1016/j.optcom.2007.02.059

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Au films of thickness ranging between 5 and 52 nm were prepared by sputtering on quartz substrates and their third-order nonlinear optical response was investigated by Optical Kerr effect (OKE) and Z-scan techniques using 532 nm, 35 ps laser pulses. All prepared films were characterized by XRD, AFM and UV-VIS-NIR spectrophotometry while their third-order susceptibility chi((3)) was measured and found to be of the order of 10(-9) esu. The real and imaginary parts of the third-order susceptibility were found in very good agreement with experimental results and theoretical predictions reported by Smith et al. [D.D. Smith, Y. Yoon, R.W. Boyd, Y.K. Cambell, L.A. Baker, R.M. Crooks, M. George, J. Appl. Phys. 86 (1999) 6200]. (c) 2007 Elsevier B.V. All rights reserved.

引用

页码：217 / 222

页数：6

共 22 条

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Boyd R.W., 1992, NONLINEAR OPTICS, P166

[2]

Chopra K. L., 1969, Thin Films Phenomena

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