Colour detection using buried triple pn junction structure implemented in BiCMOS process

被引:16
作者
Ben Chouikha, M [1 ]
Lu, GN [1 ]
Sedjil, M [1 ]
Sou, G [1 ]
机构
[1] Univ Paris 06, Lab Instruments & Syst, F-75252 Paris 05, France
关键词
D O I
10.1049/el:19980085
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A buried triple pn junction structure for colour detection is presented which can be implemented in a bipolar or BiCMOS process. The spectral responsivity of the device is characterised by three bandpass curves, selecting, respectively, blue, green and red components of a colour. A linear transformation method is developed for the colorimetric characterisation of the device. Colour differences between the detector specification and that of the CIE standard system have been evaluated. A mean colour difference of 2.15 has been obtained.
引用
收藏
页码:120 / 122
页数:3
相关论文
共 4 条
[1]   FABRICATION AND PERFORMANCE OF COLOR FILTER ARRAYS FOR SOLID-STATE IMAGERS [J].
DILLON, PLP ;
BRAULT, AT ;
HORAK, JR ;
GARCIA, E ;
MARTIN, TW ;
LIGHT, WA .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1978, 25 (02) :97-101
[2]   COLOR IMAGING-SYSTEM USING A SINGLE CCD AREA ARRAY [J].
DILLON, PLP ;
LEWIS, DM ;
KASPAR, FG .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1978, 25 (02) :102-107
[3]   Methods for characterizing colour scanners and digital cameras [J].
Johnson, T .
DISPLAYS, 1996, 16 (04) :183-191
[4]  
LU GN, 1996, MECATRONICS 96 BESAN, P276