Free-space focused-beam characterization of left-handed materials

被引：63

作者：

Li, K ^{[1
]}

McLean, SJ ^{[1
]}

Greegor, RB ^{[1
]}

Parazzoli, CG ^{[1
]}

Tanielian, MH ^{[1
]}

机构：

[1] Boeing Co, Phantom Works, Seattle, WA 98124 USA

来源：

APPLIED PHYSICS LETTERS | 2003年 / 82卷 / 15期

关键词：

D O I：

10.1063/1.1567454

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We used a broadband, free-space, focused-beam system to measure the transmission and reflection in left-handed-material (LHM) slabs. The samples were made of alternating patterns of copper wires and split-ring resonators on Rogers 5880 substrates separated by Rohacell(TM) spacers. The measured data show very good agreement with numerical simulations. The measured insertion loss of this structure was -1.1 dB/cm at the LHM pass band. Simulations suggest that the loss may be attributable to the finite conductivity of the copper patterns. (C) 2003 American Institute of Physics.

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页码：2535 / 2537

页数：3

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