Nanoscale roughness on metal surfaces can increase tip-enhanced Raman scattering by an order of magnitude

被引:151
作者
Zhang, Weihua
Cui, Xudong
Yeo, Boon-Siang
Schmid, Thomas
Hafner, Christian
Zenobi, Renato [1 ]
机构
[1] ETH, Dept Chem & Appl Biosci, CH-8093 Zurich, Switzerland
[2] ETH, Lab Electromagnet Fields & Microwave Elect, CH-8092 Zurich, Switzerland
关键词
D O I
10.1021/nl070616n
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
We studied the influence of nanosteps on signal intensity in gap-mode tip-enhanced Raman spectroscopy (TERS). A benzenethiol monolayer adsorbed on an Au substrate was investigated. The correlation between the TERS signal and the local topography on the substrate shows that a 2 nm high sharp step on the Au surface can significantly increase the enhancement. Furthermore, theoretical models were built, and the numerical simulation results were consistent with our experimental results. The findings provide evidence that nanoscale roughness can play a crucial role in the "hot sites" corresponding to single-molecule surface-enhanced Raman spectroscopy (SERS).
引用
收藏
页码:1401 / 1405
页数:5
相关论文
共 30 条
[1]  
Bohren C. F., 1983, ABSORPTION SCATTERIN
[2]   Toward Raman fingerprints of single dye molecules at atomically smooth Au(111) [J].
Domke, Katrin F. ;
Zhang, Dai ;
Pettinger, Bruno .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2006, 128 (45) :14721-14727
[3]   PHOTOPHYSICS AND PHOTOCHEMISTRY NEAR SURFACES AND SMALL PARTICLES [J].
GERSTEN, JI ;
NITZAN, A .
SURFACE SCIENCE, 1985, 158 (1-3) :165-189
[4]  
HAFNER C, 1999, POST MODERN ELECTROM
[5]   High-resolution near-field Raman microscopy of single-walled carbon nanotubes -: art. no. 095503 [J].
Hartschuh, A ;
Sánchez, EJ ;
Xie, XS ;
Novotny, L .
PHYSICAL REVIEW LETTERS, 2003, 90 (09) :4
[6]   Metallized tip amplification of near-field Raman scattering [J].
Hayazawa, N ;
Inouye, Y ;
Sekkat, Z ;
Kawata, S .
OPTICS COMMUNICATIONS, 2000, 183 (1-4) :333-336
[7]   PROBLEMS OF ROUGHNESS MEASUREMENTS USING STM [J].
HIESGEN, R ;
MEISSNER, D .
ULTRAMICROSCOPY, 1992, 42 :1403-1411
[8]   ON THE ELECTROCHEMICAL ETCHING OF TIPS FOR SCANNING TUNNELING MICROSCOPY [J].
IBE, JP ;
BEY, PP ;
BRANDOW, SL ;
BRIZZOLARA, RA ;
BURNHAM, NA ;
DILELLA, DP ;
LEE, KP ;
MARRIAN, CRK ;
COLTON, RJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (04) :3570-3575
[9]   SURFACE ENHANCED RAMAN-SCATTERING BY METAL SPHERES .1. CLUSTER EFFECT [J].
INOUE, M ;
OHTAKA, K .
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1983, 52 (11) :3853-3864
[10]   Preparation of silver tips for scanning tunneling microscopy imaging [J].
Iwami, M ;
Uehara, Y ;
Ushioda, S .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (11) :4010-4011