High-resolution optical diffraction microscopy

被引：31

作者：

Belkebir, K ^{[1
]}

Sentenac, A ^{[1
]}

机构：

[1] CNRS, Inst Fresnel, UMR 6133, F-13397 Marseille, France

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 2003年 / 20卷 / 07期

关键词：

D O I：

10.1364/JOSAA.20.001223

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

In an optical diffraction microscopy experiment, one measures the phase and amplitude of the field diffracted by the sample and uses an inversion algorithm to reconstruct its map of permittivity. We show that with an iterative procedure accounting for multiple scattering, it is possible to visualize details smaller than gimel/4 with relatively few illumination and observation angles. The roles of incident evanescent waves and noise are also investigated. (C) 2003 Optical Society of America.

引用

页码：1223 / 1229

页数：7

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