Contact angle study on polymer-grafted silicon wafers

被引:130
作者
Faibish, RS [1 ]
Yoshida, W [1 ]
Cohen, Y [1 ]
机构
[1] Univ Calif Los Angeles, Dept Chem Engn, Los Angeles, CA 90095 USA
关键词
surface roughness; contact angle; grafted polymers; surface wettability;
D O I
10.1006/jcis.2002.8612
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Surface wettability and hydrophilicity of terminally grafted PVP and PVAc on smooth silicon wafers were investigated by advancing and receding contact angle measurements. Surface wetting trends correlated with polymer graft yield. Contact angle hysteresis results did not reveal a clear dependence of surface wetting on surface roughness (determined by atomic force microscopy) at the nanoscale level. Surface roughness appeared decrease with increasing chain length for the present surfaces produced by free radical graft polymerization. Contact angle analysis in terms of surface tension components demonstrated that the degree of hydrophilicity of polymer-grafted smooth inorganic surfaces depends on both polymer functionality and polymer graft yield. It is postulated that reorientation of surface-grafted polymer chains could account for changes in surface wettability, similar to those observed for solid polymer films. (C) 2002 Elsevier Science (USA).
引用
收藏
页码:341 / 350
页数:10
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