Preparation and properties of precursor Ba-Ca-Cu(O, F) thin films deposited from fluorides for superconducting Tl- and Hg-based films

被引:9
作者
Chromik, S
Jergel, M
Hanic, F
Jimenez, S
Jergel, M
Strbík, V
Falcony, C
Benacka, S
Cheang-Wong, JC
Andrade, E
机构
[1] CINVESTAV, Dept Fis, Mexico City 07000, DF, Mexico
[2] Slovak Acad Sci, Inst Elect Engn, Bratislava 84239, Slovakia
[3] Slovak Acad Sci, Inst Measurement Sci, Bratislava 84219, Slovakia
[4] Slovak Acad Sci, Inst Phys, Bratislava 84228, Slovakia
[5] CINVESTAV, Lab Invest Mat, Queretaro 76010, Qro, Mexico
[6] Univ Nacl Autonoma Mexico, Inst Fis, Mexico City 01000, DF, Mexico
关键词
Ba-Ca-Cu-(O; F); precursors; Tl2Ba2CaCu2Oy films; fluorides; X-ray diffraction;
D O I
10.1016/S0040-6090(00)01118-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Precursor Ba-Ca-Cu-(O, F) thin films prepared by thermal evaporation of BaF2, CaF2 and Cu show good chemical resistance against the atmosphere even after a partial defluorination by means of vacuum annealing with subsequent oxidation. The prepared precursor films were characterized by X-ray diffraction (XRD) analyses and Raman scattering measurements. A possible explanation for the observed properties is presented. According to the XRD measurements performed in the grazing incidence set-up, a polycrystalline cubic BaCuO2 is the main phase after defluorination followed by oxidation. No peaks attributable to carbides (as a consequence of atmospheric exposure of the samples) were identified. Raman analysis confirmed the presence of another phase, namely CuO. (C) 2000 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:129 / 133
页数:5
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