Mixed-state Hall effect in Hg- and Tl-based superconducting thin films containing columnar defects

被引:4
作者
Kang, WN [1 ]
Kim, WS
Lee, SI
Kang, BW
Wu, JZ
Chen, QY
Chu, WK
Chu, CW
机构
[1] Pohang Univ Sci & Technol, Dept Phys, Natl Creat Res Initiat Ctr Superconduct, Pohang 790784, South Korea
[2] Univ Kansas, Dept Phys & Astron, Lawrence, KS 66045 USA
[3] Univ Houston, Texas Ctr Superconduct, Houston, TX 77204 USA
来源
PHYSICA C | 2000年 / 341卷 / 341-348期
关键词
D O I
10.1016/S0921-4534(00)01138-2
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have investigated the mixed-state Hall resistivity rho (xy) and longitudinal resistivity rho (xy) in HgBa2CaCu2O6, HgBa2Ca2Cu3O8, and Tl2Ba2CaCu2O8 thin films for various parameters, such as densities of columnar defects, number of CuO2 planes, and anisotropy ratios, as a function of the magnetic field up to 18 T. The scaling exponent beta in rho (xy) = A rho (beta)(xx) is 1.9 +/- 0.1 in the clean limit (CL) at high fields and low T whereas beta is 1 +/- 0.1 in the moderately clean Limit (MCL) at low fields and high T. We also find the triple sign reversal in the HgBa2CaCu2O6 films containing high-density columnar defects. These results can be interpreted within the context of a recent theory based on the midgap states in the vortex core.
引用
收藏
页码:1235 / 1236
页数:2
相关论文
共 6 条
[1]   HALL ANGLE EVIDENCE FOR THE SUPERCLEAN REGIME IN 60K YBA2CU3O6+Y [J].
HARRIS, JM ;
YAN, YF ;
TSUI, OKC ;
MATSUDA, Y ;
ONG, NP .
PHYSICAL REVIEW LETTERS, 1994, 73 (12) :1711-1714
[2]   Growth of HgBa2Ca2Cu3O8 thin films using stable Re0.1Ba2Ca2Cu3Ox precursor by pulsed laser deposition [J].
Kang, WN ;
Meng, RL ;
Chu, CW .
APPLIED PHYSICS LETTERS, 1998, 73 (03) :381-383
[3]  
KANG WN, 1999, PHYS REV B, V59, P9031
[4]   Hall effect in moderately clean superconductors and the transverse force on a moving vortex [J].
Kopnin, NB .
PHYSICAL REVIEW B, 1996, 54 (13) :9475-9483
[5]  
KOPNIN NB, PHYS REV B, V51
[6]   SCALING OF THE LONGITUDINAL AND HALL RESISTIVITIES FROM VORTEX MOTION IN YBA2CU3O7 [J].
LUO, J ;
ORLANDO, TP ;
GRAYBEAL, JM ;
WU, XD ;
MUENCHAUSEN, R .
PHYSICAL REVIEW LETTERS, 1992, 68 (05) :690-693