Computed microtomography studies to characterize microstructure-property correlations in thermal sprayed alumina deposits

被引：48

作者：

Kulkarni, A ^{[1
]}

Sampath, S

Goland, A

Herman, H

Dowd, B

机构：

[1] SUNY Stony Brook, Stony Brook, NY 11794 USA

[2] Brookhaven Natl Lab, Upton, NY 11973 USA

来源：

SCRIPTA MATERIALIA | 2000年 / 43卷 / 05期

基金：

美国国家科学基金会;

关键词：

computed microtomography; thermal spraying; ceramics; porosity; thermal conductivity; dielectric properties;

D O I：

10.1016/S1359-6462(00)00416-4

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

X-ray computed microtomography (CMT) is a nondestructive imaging technique that provides cross-sectional view of the interior of an object. CMT allows studies of normally difficult to analyze microstructural features of thermal sprayed coatings. The influence of processing techniques and feedstock characteristics on porosity and its effect on the thermal conductivity and dielectric properties of alumina coatings is reported.

引用

页码：471 / 476

页数：6

共 10 条

[1]

*ASM INT, 1992, ASM HDB, V17, P358

[2]

DOWD BA, 1999, ADV XRAY ANAL, P42

[3] 3-DIMENSIONAL X-RAY MICROTOMOGRAPHY [J].