Environmental ageing of adhesively-bonded joints. I. Dielectric studies

被引:22
作者
Joshi, SB
Pethrick, RA
Gilmore, R
Yates, LW
Hayward, D
机构
[1] Univ Strathclyde, Dept Pure & Appl Chem, Glasgow G1 1XL, Lanark, Scotland
[2] Def Res Agcy, Struct Mat Ctr, Farnborough, Hants, England
[3] British Aerosp PLC, Civil Aircraft Div, Hatfield, Herts, England
关键词
dielectric studies; epoxy resin; phenolic adhesive; environmental ageing; water ingress; aluminium oxide;
D O I
10.1080/00218469708014573
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
High and low frequency dielectric measurements are reported on adhesively bonded aluminum structures aged by exposure to moisture over an extended period of time. The changes observed are interpreted in terms of initially water diffusing into the adhesive layer and there is little evidence of changes occurring to the surface oxide layer. Differences in the form and rate of change of the dielectric signature reflect the effects of the pretreatment and matrix resin on the water diffusion process. A good correlation is observed between the time domain data and the increased dielectric permittivity resulting from ingress of moisture into the adhesive bend. The paper illustrates the use of high frequency dielectric measurements in non-destructively probing adhesive bonds and indicates the potential for in-situ applications.
引用
收藏
页码:281 / 315
页数:35
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