Self-imaging phenomena in multi-mode photonic crystal line-defect waveguides: application to wavelength de-multiplexing

被引:86
作者
Kim, HJ [1 ]
Park, I [1 ]
O, BH [1 ]
Park, SG [1 ]
Lee, EH [1 ]
Lee, SG [1 ]
机构
[1] Inha Univ, Sch Informat & Commun Engn, Opt & Photon Elite Res Acad, Inchon 402751, South Korea
关键词
D O I
10.1364/OPEX.12.005625
中图分类号
O43 [光学];
学科分类号
070207 [光学]; 0803 [光学工程];
摘要
We show that the self-imaging principle still holds true in multi-mode photonic crystal (PhC) line-defect waveguides just as it does in conventional multi-mode waveguides. To observe the images reproduced by this self-imaging phenomenon, the finite-difference time-domain computation is performed on a multi-mode PhC line-defect waveguide that supports five guided modes. From the computed result, the reproduced images are identified and their positions along the propagation axis are theoretically described by self-imaging conditions which are derived from guided mode propagation analysis. We report a good agreement between the computational simulation and the theoretical description. As a possible application of our work, a photonic crystal 1-to-2 wavelength de-multiplexer is designed and its performance is numerically verified. This approach can be extended to novel designs of PhC devices. (C) 2004 Optical Society of America.
引用
收藏
页码:5625 / 5633
页数:9
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