Electrostatic self-assembly of sulfonated C60-porphyrin complexes on chitosan thin films

被引：17

作者：

Jiang, H

Su, W

Hazel, J

Grant, JT

Tsukruk, VV

Cooper, TM

Bunning, TJ ^{[1
]}

机构：

[1] USAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA

[2] Anteon Co, Dayton, OH 45431 USA

[3] Tech Management Concepts Inc, Beavercreek, OH 45432 USA

[4] Univ Dayton, Res Inst, Dayton, OH 45469 USA

[5] Iowa State Univ, Dept Mat Sci & Engn, Ames, IA 50011 USA

来源：

THIN SOLID FILMS | 2000年 / 372卷 / 1-2期

关键词：

atomic force microscopy (AFM); polymers; surface structure; X-ray photoelectron spectroscopy (XPS);

D O I：

10.1016/S0040-6090(00)01033-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Sulfonatcd C-60, 5,10,15,20-tetra kis 4-[meso-tetra-methyl (4-pyridinyl)] porphyrin (C-60(SO3-)(n)-TMePyP4+) complex films have been prepared by electrostatic self-assembly of each chromophore from solution. When these complex films are formed on a thin film of chitosan polymer, the stacked bilayer films exhibit nearly twice the absorption as those prepared on conventional silanized substrates. X-ray photoelectron spectroscopy measurements disclose a strong interaction between the C-60(SO3-)(n) and TMePyP4+. Atomic force microscopy results of the surface morphology, hardness, and the chemical functionality are used to explain the differences between substrate treatments. (C) 2000 Elsevier Science S.A. All rights reserved.

引用

页码：85 / 93

页数：9

共 34 条

[1] Assembling alternate dye-polyion molecular films by electrostatic layer-by-layer adsorption [J].