Measurement of microscopic stress distribution of multilayered composite by X-ray stress analysis

被引:16
作者
Adachi, T [1 ]
Sekino, T [1 ]
Nakayama, T [1 ]
Kusunose, T [1 ]
Niihara, K [1 ]
机构
[1] Osaka Univ, Inst Sci & Ind Res, Ibaraki, Osaka 5670047, Japan
关键词
multilayer structure; residual stress; stress distribution; x-ray techniques; nanocomposite; ceramics;
D O I
10.1016/S0167-577X(02)01436-2
中图分类号
T [工业技术];
学科分类号
08 [工学];
摘要
In order to evaluate the effect of nano-sized dispersoid to microscopic stress distribution of multilayered composite, two kinds of multilayered composites, Al2O3/3 mol% Y2O3-stabilized ZrO2 (3Y-TZP) and Al2O3/3Y-TZP(SiC), were fabricated. The latter composite contained nano-sized SiC dispersion within 3Y-TZP layers. The micro-residual stress measurement by Xray diffraction (XRD) analysis for the monolithic 3Y-TZP and 3Y-TZP(SiC) nanocomposite layers within each composite revealed the existence of tensile and compressive stresses perpendicular and parallel directions to the layers, respectively. The tensile stress of approximately 200-300 MPa was observed to distribute across the zirconia layers in both composites. On the other hand, much higher compressive stress (i.e., 500-700 MPa) existed with a steep distribution across the layer especially for the monolithic Al2O3/3Y-TZP multilayered composite. However, both tensile and compressive stress distributions were found to be flattened when nano-sized SiC was incorporated into 3Y-TZP layer. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:3057 / 3062
页数:6
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