High-resolution Raman microscopy of curled carbon nanotubes

被引:30
作者
Ko, HH [1 ]
Pikus, Y
Jiang, CY
Jauss, A
Hollricher, O
Tsukruk, VV
机构
[1] Iowa State Univ, Dept Mat Sci & Engn, Ames, IA 50011 USA
[2] WITec GmbH, D-89081 Ulm, Germany
基金
美国国家航空航天局;
关键词
D O I
10.1063/1.1795981
中图分类号
O59 [应用物理学];
学科分类号
摘要
Patterned carbon nanotube assemblies with bent nanotube bundles were investigated with combined atomic force microscopy and confocal Raman imaging spectroscopy to identify conditions of carbon nanotubes in the bent state. We showed that the tangential G mode on Raman spectra systematically shifts downward upon nanotube bending as was predicted earlier. This lower frequency shift is attributed to the tensile stress, which results in the loosening of C-C bonds in the outer nanotube walls. (C) American Institute of Physics.
引用
收藏
页码:2598 / 2600
页数:3
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