Normalised analysis for the design of evanescent-wave sensors and its use for tolerance evaluation

被引：12

作者：

Brioude, V ^{[1
]}

Parriaux, O ^{[1
]}

机构：

[1] Univ St Etienne, UMR 5516, Lab TSI, F-42023 St Etienne, France

来源：

OPTICAL AND QUANTUM ELECTRONICS | 2000年 / 32卷 / 6-8期

关键词：

evanescent-wave; optical waveguide; sensitivity analysis; sensors;

D O I：

10.1023/A:1007030931823

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The conditions for the optimisation of any step index waveguide evanescent-wave sensor and for the manufacturing tolerances are given in the form of analytical and normalised expressions. The analysis is made for both TE and TM modes, in both cases where the measurand is homogeneously distributed in the cover, and where it is an ultrathin film on the waveguide-cover interface.

引用

页码：899 / 908

页数：10

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