Deep-ultraviolet contact photolithography

被引:16
作者
Goodberlet, JG [1 ]
Dunn, BL [1 ]
机构
[1] MIT, Elect Res Lab, Cambridge, MA 02139 USA
关键词
D O I
10.1016/S0167-9317(00)00272-0
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The patterning of 100 nm features via contact photolithography is described. Details of a conformable embedded-amplitude mask and pattern transfer into a tri-layer resist with this mask are presented. In-plane pattern-placement errors for this lithographic process have been measured to be less than 60 nm.
引用
收藏
页码:95 / 99
页数:5
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