Noise performance of a color CMOS photogate image sensor

被引：13

作者：

Blanksby, AJ ^{[1
]}

Loinaz, MJ ^{[1
]}

Inglis, DA ^{[1
]}

Ackland, BD ^{[1
]}

机构：

[1] Univ Adelaide, Dept Elect & Elect Engn, Adelaide, SA 5005, Australia

来源：

INTERNATIONAL ELECTRON DEVICES MEETING - 1997, TECHNICAL DIGEST | 1997年

关键词：

D O I：

10.1109/IEDM.1997.650337

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We report on the noise performance of a color CMOS photogate image sensor that supports two levels of correlated double sampling and has high conversion gain at each pixel. Imager performance is limited by low quantum efficiency and dark current non-uniformity and not by read-out circuit temporal or fixed-pattern noise.

引用

页码：205 / 208

页数：4