Computer vision applied to the automatic calibration of measuring instruments

被引:49
作者
Alegria, FC
Serrá, AC [1 ]
机构
[1] Univ Tecn Lisboa, Inst Telecomun, P-1100 Lisbon, Portugal
[2] Univ Tecn Lisboa, Dept Elect & Comp Engn, Inst Super Tecn, P-1100 Lisbon, Portugal
关键词
automatic measurement; calibration; computer vision;
D O I
10.1016/S0263-2241(00)00011-7
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper presents computer vision techniques developed for an automatic calibration system that can automatically determine the reading of the measuring instruments even if they do not have a digital interface that enables the computer to communicate with it. The system is capable of working with instruments that have an analog or a digital display. The error in the determination of the instrument's reading is less than that introduced by the human eye/brain when the calibration is done manually. (C) 2000 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:185 / 195
页数:11
相关论文
共 10 条
[1]  
ALEGRIA FC, 2000, IN PRESS IEEE T INST, V49
[2]   A PC-based adaptive software for automatic calibration of power transducers [J].
Chen, CL ;
Wang, SC .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1997, 46 (05) :1145-1149
[3]  
Hough PV., 1962, US Patent, Patent No. 3069654
[4]  
Jain A. K., 1989, FUNDAMENTALS IMAGE P
[5]   Automated guarded bridge for calibration of multimegohm standard resistors from 10 M Omega to 1 T Omega [J].
Jarrett, DG .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1997, 46 (02) :325-328
[6]   A HIGH-ACCURACY 10 HZ-1 MHZ AUTOMATIC AC VOLTAGE CALIBRATION SYSTEM [J].
OLDHAM, NM ;
PARKER, ME ;
YOUNG, AM ;
SMITH, AG .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1987, 36 (04) :883-887
[7]  
SABLATNIG R, 1995, P SOC PHOTO-OPT INS, V2423, P356, DOI 10.1117/12.205522
[8]  
SABLATNIG R, 1994, P 12 IAPR INT C PATT, P479
[9]  
Schalkoff Robert J., 1989, Digital image processing and computer vision
[10]   COMPUTER-AIDED DMM CALIBRATION SOFTWARE WITH ENHANCED AC PRECISION [J].
SMITH, JA ;
KATZMANN, FL .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1987, 36 (04) :888-893