Topographic SAR interferometry formulation for high-precision DEM generation

被引:36
作者
Abdelfattah, R
Nicolas, JM
机构
[1] Ecole Natl Ingenieurs Tunis, Lab Teledetect & Syst Informat References Spatial, Tunis, Tunisia
[2] Ecole Natl Super Telecommun Bretagne, Dept Traitement Signal & Images, F-75634 Paris 13, France
来源
IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING | 2002年 / 40卷 / 11期
关键词
interferogram simulator; mapping relief; orbital parameters; phase-to-height conversion; SAR interferometry;
D O I
10.1109/TGRS.2002.805071
中图分类号
P3 [地球物理学]; P59 [地球化学];
学科分类号
0708 ; 070902 ;
摘要
In repeat-pass synthetic aperture radar (SAR) interferometry, the approximations, allowing the phase-to-height conversion, prevent high-resolution mapped relief. In this paper, we present a more general and exact formulation giving a new relationship between the interferogram phase and the target height. It is based on the interferometric SAR geometry and on a better expansion of the path length difference between the sensor and the target. This formulation emphasizes the impact of baseline uncertainties on digital elevation model (DEM) accuracy. A quantitative assessment of the required baseline accuracy is computed. The impact of orbital parameters, used in the new formulation, on interferogram generation is studied. Thus, a new simulator algorithm is developed and tested on a set of reference and simulated DEM examples. Examples of interferogram simulation and DEM generation validate this new approach in the case of a mountainous area in Mustang (Nepal).
引用
收藏
页码:2415 / 2426
页数:12
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