Molecular orientation at rubbed polyimide surfaces determined with X-ray absorption spectroscopy: Relevance for liquid crystal alignment

被引：95

作者：

Weiss, K

Woll, C

Bohm, E

Fiebranz, B

Forstmann, G

Peng, B

Scheumann, V

Johannsmann, D

机构：

[1] Max Planck Inst Polymer Res, D-55021 Mainz, Germany

[2] Univ Bochum, D-44780 Bochum, Germany

[3] Merck KGaA, D-64371 Darmstadt, Germany

来源：

MACROMOLECULES | 1998年 / 31卷 / 06期

关键词：

D O I：

10.1021/ma971075z

中图分类号：

O63 [高分子化学（高聚物）];

学科分类号：

070305 ; 080501 ; 081704 ;

摘要：

The molecular orientation at the surface of polyimide (PI) alignment layers used for liquid crystal displays has been determined using X-ray absorption spectroscopy (NEXAFS). The second moments of the orientation distribution function obtained from a detailed analysis reveal that, upon rubbing, the PI substrates develop biaxiality and an inclination of a few degrees. For a nematic liquid crystal (LC) in contact with these alignment layers, the pretilt angle was determined and revealed a weak correlation with buffing strength.

引用

页码：1930 / 1936

页数：7

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