Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level

被引：6

作者：

Hoornaert, S ^{[1
]}

Treiger, B ^{[1
]}

Valkovic, V ^{[1
]}

Van Grieken, R ^{[1
]}

机构：

[1] Univ Antwerp, Dept Chem, Micro & Trace Anal Ctr, B-2610 Antwerp, Belgium

来源：

MIKROCHIMICA ACTA | 1998年 / 128卷 / 3-4期

关键词：

homogeneity; reference materials; electron probe X-ray microanalysis;

D O I：

10.1007/BF01243051

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

A new approach to the assessment of homogeneity for powder samples of candidate reference materials with the help of electron probe X-ray microanalysis (EPMA) is proposed, It is based on the utilisation of the Kolmogorov-Smirnov statistics coupled with the Akaike Information Criterion in the processing of the quantitative EPMA data. The evaluation of three IAEA candidate reference materials with the described approach is discussed.

引用

页码：207 / 213

页数：7

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