Large-area, low-noise amorphous silicon imaging system

被引：9

作者：

Apte, RB ^{[1
]}

Street, RA ^{[1
]}

Ready, SE ^{[1
]}

Jared, DA ^{[1
]}

Moore, AM ^{[1
]}

Weisfield, RL ^{[1
]}

Rodericks, TA ^{[1
]}

Granberg, TA ^{[1
]}

机构：

[1] Xerox PARC, Palo Alto, CA USA

来源：

SOLID STATE SENSOR ARRAYS: DEVELOPMENT AND APPLICATIONS II | 1998年 / 3301卷

关键词：

amorphous silicon; thin film transistor; double correlated sampling; active matrix imager; readout noise; linearity; x-rays; noise power spectrum;

D O I：

10.1117/12.304549

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Two dimensional amorphous silicon arrays can be used for medical imaging, non-destructive testing, and high-speed document scanning. We have built a 200 spi imaging system with an active area containing 2304 x 3200 pixels (29.2 x 40.6 cm(2)), the largest amorphous silicon imaging system described to date. Packaged with the array are peripheral electronics which include active matrix drivers, charge sensitive amplifiers, two 12 bit A/D converters, and control logic. Digital data travel via fiber to a frame grabber in a personal computer. Software includes gain/offset corrections, line and pixel corrections, window and level controls, and a user interface. Through a combination of layout optimization, amplifier design, and system timing, we have demonstrated a noise level of 1.5 KeRMS and a signal to noise ratio of 1900.

引用

页码：2 / 8

页数：7