Improving sensitivity of a small angle x-ray scattering camera with pinhole collimation using separated optical elements

被引:39
作者
Zemb, T [1 ]
Taché, O [1 ]
Né, F [1 ]
Spalla, O [1 ]
机构
[1] Ctr Etud Saclay, CEA, DRECAM, Serv Chim Mol, F-91191 Gif Sur Yvette, France
关键词
D O I
10.1063/1.1556954
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We show that a significant improvement in the sensitivity of a Huxley-Holmes design for a small angle x-ray scattering camera is obtained by separating the mirror and the monochromator. The design of the camera involves a long x-ray mirror close to a point x-ray source associated with a curved focusing crystal located close to the sample. The sample area is located at half the distance between the source and detector planes. Diffuse scattering produced by the mirror is not incident on the focusing crystal, thus reducing the background signal. Complete elimination of hard x rays allows precise calibration and hence absolute determination of sample cross section by means of a semitransparent beam stop. In pinhole geometry, the flux corresponds to a similar to10(7) photons/s through the sample, collimated to 10(-2) A(-1) in q range. This allows determination of scattered intensities on the order of 10(-3) cm(-1), corresponding to the scattering related to isothermal compressibility of less than 0.1 mm of pure water. As a reference sample, the widely used Lupolen(TM), a semicrystalline polymer, is calibrated. The high-q limit (qapproximate to4.5 nm(-1)) of a porous calcite sample can be used as a secondary standard for specific area determination of solid/solid or solid-liquid dispersions. (C) 2003 American Institute of Physics.
引用
收藏
页码:2456 / 2462
页数:7
相关论文
共 27 条
[1]  
AMAGALIAN M, 1998, J APPL CRYSTALLOGR, V31, P235
[2]  
[Anonymous], DOUBLE HELIX
[3]  
BOSIO L, 1981, PHYS REV LETT, V46, P9
[4]   Molecular force measurement between bilayers using a controlled osmotic-pressure X-ray scattering technique [J].
Dubois, M ;
Zemb, T .
JOURNAL DE PHYSIQUE IV, 1998, 8 (P5) :55-62
[5]   X-RAY REFLECTIVITY OF BENT PERFECT CRYSTALS IN BRAGG AND LAUE GEOMETRY [J].
EROLA, E ;
ETELANIEMI, V ;
SUORTTI, P ;
PATTISON, P ;
THOMLINSON, W .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1990, 23 :35-42
[6]   POSITION-SENSITIVE X-RAY DETECTOR [J].
GABRIEL, A .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1977, 48 (10) :1303-1305
[7]  
Guinier A., 1995, SMALL ANGLE SCATTERI
[8]  
GUINIER A, 1955, SMALL ANGLE SCATTERI, P47
[9]   X-RAY ZERO-ANGLE SCATTERING CROSS-SECTION OF WATER [J].
HENDRICKS, RW ;
MARDON, PG ;
SHAFFER, LB .
JOURNAL OF CHEMICAL PHYSICS, 1974, 61 (01) :319-322
[10]   CHARACTERISTIC X-RAY FLUX FROM SEALED CR, CU, MO, AG AND W TUBES [J].
HONKIMAKI, V ;
SLEIGHT, J ;
SUORTTI, P .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1990, 23 :412-417