Extrinsic contributions to spin-wave damping and renormalization in thin Ni50Fe50 films

被引：96

作者：

Azevedo, A ^{[1
]}

Oliveira, AB ^{[1
]}

de Aguiar, FM ^{[1
]}

Rezende, SM ^{[1
]}

机构：

[1] Univ Fed Pernambuco, Dept Fis, BR-50670901 Recife, PE, Brazil

来源：

PHYSICAL REVIEW B | 2000年 / 62卷 / 09期

关键词：

D O I：

10.1103/PhysRevB.62.5331

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Ferromagnetic resonance has been used to study the room-temperature linewidth and frequency shift of the q=0 spin-wave mode in thin films of NiFe sputtered on Si(100) substrates. The data on the variation of the linewidth and resonance field with film thickness are completely consistent with the extrinsic mechanism recently proposed by Arias and Mills based on momentum nonconserving two-magnon scattering off defects on the film surfaces.

引用

页码：5331 / 5333

页数：3

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