Technique to estimate the reflectance of a high-reflectance dielectric multilayer coating mirror using incident beam angular dependence of its transmittance

被引:5
作者
Miyoki, S [1 ]
Sato, S [1 ]
Ohashi, M [1 ]
Fujimoto, MK [1 ]
机构
[1] Natl Astron Observ, Spacetime Astron Sect, Tokyo 181, Japan
关键词
high-reflectance; dielectric multilayer coating mirror; reflectance; transmittance; ultralow loss; complex refractive index; incident angle; absorption loss; scattering loss;
D O I
10.1007/s10043-998-0017-9
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The reflectance of a high-reflectance dielectric muitilayer coating minor tuned to a monochromatic laser wavelength was estimated from its transmittance which was measured with 0.4 ppm accuracy. The transmittance was calculated from its theoretical formula including three parameters (refractive indexes of low and high refractive films (n(L), n(H)) and a number of layer units composed of a pair of one low and one high refractive film (N)) which were estimated from the incident beam angular dependence curve of the transmittance. This calculated transmittance agreed with that measured as a ratio of the laser beam power before and after the mirror with 6 ppm difference.
引用
收藏
页码:17 / 19
页数:3
相关论文
共 4 条
[1]   MIRROR REFLECTOMETER BASED ON OPTICAL CAVITY DECAY TIME [J].
ANDERSON, DZ ;
FRISCH, JC ;
MASSER, CS .
APPLIED OPTICS, 1984, 23 (08) :1238-1245
[2]  
HUMMEL RE, 1995, HDB OPTICAL PROPERTI, V1, P79
[3]   Ultra-high quality cavity with 1.5 ppm loss at 1064 nm [J].
Ueda, A ;
Uehara, N ;
Uchisawa, K ;
Ueda, K ;
Sekiguchi, H ;
Mitake, T ;
Nakamura, K ;
Kitajima, N ;
Kataoka, I .
OPTICAL REVIEW, 1996, 3 (05) :369-372
[4]   ACCURATE MEASUREMENT OF ULTRALOW LOSS IN A HIGH-FINESSE FABRY-PEROT-INTERFEROMETER USING THE FREQUENCY-RESPONSE FUNCTIONS [J].
UEHARA, N ;
UEDA, K .
APPLIED PHYSICS B-LASERS AND OPTICS, 1995, 61 (01) :9-15