Formation and annihilation of a bond defect in silicon: An ab initio quantum-mechanical characterization

被引:72
作者
Cargnoni, F
Gatti, C
Colombo, L
机构
[1] CNR, Ctr Studio Relaz Struttura & Reatt Chim, I-20133 Milan, Italy
[2] Univ Milan, INFM, I-20126 Milan, Italy
[3] Univ Milan, Dipartimento Sci Mat, I-20126 Milan, Italy
关键词
D O I
10.1103/PhysRevB.57.170
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The electronic structure and bond properties of a lattice defect in silicon formed by the incomplete recombination of a vacancy-interstitial pair are described by combining tight-binding molecular-dynamics and ab initio Hartree-Fock calculations. The defect structure consists of a large nuclear distortion nearly perfectly compensated by electron charge rearrangment. The reaction path for its annihilation is reported and described in terms of an electron-density topological analysis within the quantum theory of atoms in molecules approach.
引用
收藏
页码:170 / 177
页数:8
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