Fast optical assessment of pesticide coverage on plants

被引:6
作者
Hake, Harald
Ben-Zur, Ravid
Schechter, Israel [1 ]
Anders, Angelika
机构
[1] Technion Israel Inst Technol, Schulich Fac Chem, IL-32000 Haifa, Israel
[2] Leibniz Univ Hannover, Inst Biophys, D-30419 Hannover, Germany
[3] Technion Israel Inst Technol, Grand Water Res Inst, IL-32000 Haifa, Israel
关键词
pesticide; detection; plant; laser; fluorescence;
D O I
10.1016/j.aca.2007.05.061
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
This study addresses the necessity to provide fast assessment of pesticide coverage on plants, which is required for saving the expensive compounds and for protecting the environment against overdosing. The feasibility of applying several optical methods for direct detection of the pesticides on plants has been investigated. In order to overcome the matrix effect, which is related to plant fluorescence emission and to physiological spectral interferences, we suggest the application of a fluorescent labeling agent, in form of nano- and micro-crystallites. The coverage assessment is based on the spectral effects related to the interaction of these crystallites with the pesticides. Among the studied features are the fluorescence quenching/enhancement, spectral shifts and fluorescence lifetimes. It has been found that these spectral features are adequate for mapping the pesticides on plant surfaces, and assessing their coverage. Direct charge-coupled-device (CCD) fluorescence imaging was found as a low-cost adequate method, while Fourier transform spectral imaging provided more specific and accurate results. (c) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:1 / 8
页数:8
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