Instantaneous phase-shifted Speckle interferometer for measurement of large optical structures

被引：5

作者：

Saif, BN ^{[1
]}

Millerd, J ^{[1
]}

Keski-Kuha, R ^{[1
]}

Feinberg, L ^{[1
]}

Wyant, JC ^{[1
]}

机构：

[1] Space Telescope Sci Inst, Baltimore, MD 21219 USA

来源：

OPTICAL FABRICATION, METROLOGY, AND MATERIAL ADVANCEMENTS FOR TELESCOPES | 2004年 / 5494卷

关键词：

DSPI; simultaneous phase shifting; experimental mechanics;

D O I：

10.1117/12.550847

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Digital Speckle Pattern Interferometry (DSPI) is a well-established method for the measurement of diffuse objects in experimental mechanics. DSPIs are phase shifting interferometers. Three or four bucket temporal phase shifting algorithms are commonly used to provide phase shifting. These algorithms are sensitive to vibrations and can not be used to measure large optical structures far away from the interferometer. In this research a simultaneous phase shifted interferometer, PhaseCam product of 4D Technology Corporation in Tucson Arizona, is modified to be a Simultaneous phase shifted Digital Speckle Pattern Interferometer (SDSPI). Repeatability, dynamic range, and accuracy of the SDSPI are characterized by measuring a 5 cm x 5 cm carbon fiber coupon.

引用

页码：152 / 162

页数：11