Fabrication, microstructure and stress effects in sputtered TiNi thin films

被引:23
作者
Grummon, DS [1 ]
机构
[1] Michigan State Univ, Dept Mech & Mat Sci, E Lansing, MI 48823 USA
来源
SHAPE MEMORY MATERIALS | 2000年 / 327-3卷
关键词
shape-memory; MEMS; actuators; TiNi; thin films; sputtering; residual stresses;
D O I
10.4028/www.scientific.net/MSF.327-328.295
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Sputtered thin films of equiatomic TiNi and TiNiX ternary alloys have excellent mechanical properties and exhibit robust shape-memory and transformational superelasticity. Furthermore, the energetic nature of the sputter deposition process allows the creation of highly refined microstructures that are difficult to achieve by melt-solidification. The present paper will present recent work on the relationship between processing, microstructure and properties of binary TiNi thin films, focusing primarily on residual stresses, kinetics of stress-relaxation and crystallization, and fine grain sizes achievable using hot-substrate direct crystallization.
引用
收藏
页码:295 / 302
页数:8
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