机构:
Stanford Univ, Paul G Allen Ctr Integrated Syst, Stanford, CA 94305 USAStanford Univ, Paul G Allen Ctr Integrated Syst, Stanford, CA 94305 USA
Franca-Neto, LM
[1
]
Harris, JS
论文数: 0引用数: 0
h-index: 0
机构:
Stanford Univ, Paul G Allen Ctr Integrated Syst, Stanford, CA 94305 USAStanford Univ, Paul G Allen Ctr Integrated Syst, Stanford, CA 94305 USA
Harris, JS
[1
]
机构:
[1] Stanford Univ, Paul G Allen Ctr Integrated Syst, Stanford, CA 94305 USA
来源:
INTERNATIONAL ELECTRON DEVICES MEETING - 1997, TECHNICAL DIGEST
|
1997年
关键词:
D O I:
10.1109/IEDM.1997.650387
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
This work explains a new and unified microscopic treatment for noise in semiconductor devices which is well suited for the design of low noise FET's for wireless communications applications. A computational procedure for the calculation of device noise performance is described and simulated results are compared with published results for Submicron CMOS transistors.