XPS and XRD study of the electrochromic mechanism of WOx films

被引：38

作者：

Wang, XG

Jang, YS

Yang, NH

Yuan, L

Pang, SJ

机构：

[1] Northeastern Univ, Fac Mech Engn, Dept Vacuum Engn, Shenyang 110006, Peoples R China

[2] Acad Sinica, Beijing Lab Vacuum Phys, Beijing 100080, Peoples R China

来源：

SURFACE & COATINGS TECHNOLOGY | 1998年 / 99卷 / 1-2期

关键词：

electrochromic; ion valence; phases; relative content;

D O I：

10.1016/S0257-8972(97)00415-5

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

XPS, XRD and other techniques were used to study the phase, composition and valence states of W and O ions of electrochromic (EC) WOx films prepared by DC magnetron reactive sputtering. The XRD results indicate that different EC WOx films consist of different phases and compositions. XPS results reveal that W6+, W5+ and W4+ ions coexist in colored WOx films, but only W6+ ions are detected in bleached WOx films. The binding energy and the relative content of the O Is peaks of WOx films are very different for the bleached and colored states. (C) 1998 Elsevier Science S.A.

引用

页码：82 / 86

页数：5

共 10 条

[1] A MODEL FOR ELECTROCHROMIC TUNGSTIC OXIDE MICROSTRUCTURE AND DEGRADATION [J].