Influence of interface-dipole interactions on the efficiency of fluorescence light collection near surfaces

被引:29
作者
Enderlein, J [1 ]
Böhmer, M [1 ]
机构
[1] Forschungszentrum, Inst Biol Informat Proc 1, D-52425 Julich, Germany
关键词
D O I
10.1364/OL.28.000941
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Recently Torok and colleagues published in a series of papers a general wave-optical approach to calculating the light-collection efficiency function (CEF) for confocal imaging of dipole emitters [J. Mod. Opt. 45, 1681 (1998); J. Microsc. 194, 127 (1999); Opt. Lett. 25, 1463 (2000)]. In their theory they did not address the possibility that the lifetimes of fluorescing molecules can change significantly near interfaces, which has a direct effect on the CEF. The research of Torok and colleagues is extended here to include this effect, which may become important for imaging near surfaces. (C) 2003 Optical Society of America.
引用
收藏
页码:941 / 943
页数:3
相关论文
共 13 条
[1]  
Abramowitz M, 1984, HDB MATH FUNCTIONS
[2]   Theoretical study of detection of a dipole emitter through an objective with high numerical aperture [J].
Enderlein, J .
OPTICS LETTERS, 2000, 25 (09) :634-636
[3]   Highly efficient optical detection of surface-generated fluorescence [J].
Enderlein, J ;
Ruckstuhl, T ;
Seeger, S .
APPLIED OPTICS, 1999, 38 (04) :724-732
[4]   Single-molecule fluorescence near a metal layer [J].
Enderlein, J .
CHEMICAL PHYSICS, 1999, 247 (01) :1-9
[5]   Total internal reflection fluorescence correlation spectroscopy for counting molecules at solid/liquid interfaces [J].
Hansen, RL ;
Harris, JM .
ANALYTICAL CHEMISTRY, 1998, 70 (13) :2565-2575
[6]   Imaging properties of high aperture multiphoton fluorescence scanning optical microscopes [J].
Higdon, PD ;
Török, P ;
Wilson, T .
JOURNAL OF MICROSCOPY-OXFORD, 1999, 193 :127-141
[7]   Subwavelength patterns and high detection efficiency in fluorescence correlation spectroscopy using photonic structures [J].
Lenne, PF ;
Etienne, E ;
Rigneault, H .
APPLIED PHYSICS LETTERS, 2002, 80 (22) :4106-4108
[8]   Optical properties of metallic films for vertical-cavity optoelectronic devices [J].
Rakic, AD ;
Djurisic, AB ;
Elazar, JM ;
Majewski, ML .
APPLIED OPTICS, 1998, 37 (22) :5271-5283
[9]   ELECTROMAGNETIC DIFFRACTION IN OPTICAL SYSTEMS .2. STRUCTURE OF THE IMAGE FIELD IN AN APLANATIC SYSTEM [J].
RICHARDS, B ;
WOLF, E .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1959, 253 (1274) :358-379
[10]   Propagation of electromagnetic dipole waves through dielectric interfaces [J].
Török, P .
OPTICS LETTERS, 2000, 25 (19) :1463-1465