Aging of iron manganite negative temperature coefficient thermistors

被引：18

作者：

Battault, T ^{[1
]}

Legros, R ^{[1
]}

Rousset, A ^{[1
]}

机构：

[1] Univ Toulouse 3, CNRS, URA 1311, Lab Chim Mat Inorgan, F-31062 Toulouse, France

来源：

JOURNAL OF MATERIALS RESEARCH | 1998年 / 13卷 / 05期

关键词：

D O I：

10.1557/JMR.1998.0176

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Aging, defined as the drift of resistance with temperature after 1000 h was investigated for iron manganite temperature coefficient thermistors, For these devices, aging is relatively large, about 10%. The cationic distributions before and after aging were determined by Mossbauer spectroscopy. These distributions explain all the x-ray diffraction and correlated electrical data. The origin or the aging observed on Iron manganites thermistors has been identified. It is due to the migration of Fe3+ ions from tetrahedral to octahedral sites of the spinel structure in order to reach a structural equilibrium.

引用

页码：1238 / 1242

页数：5

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