Near-field optical lithography using a planar silver lens

被引:22
作者
Melville, DOS [1 ]
Blaikie, RJ [1 ]
机构
[1] Univ Canterbury, Dept Elect & Comp Engn, MacDiarmid Inst Adv Mat & Nanotechnol, Christchurch 1, New Zealand
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2004年 / 22卷 / 06期
关键词
D O I
10.1116/1.1813462
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A variation of proximity lithography has been proposed using a planar metallic film in a near-field configuration, where metal acts as a near-field "superlens." We report here on experimental evidence of such optical lithography with, a planar silver lens. Silver layers of varying thickness (85-120 nm) placed at specific distances (40-60 nm) below a patterned mask were able to image the mask's features onto a photoresist located after a gap (26-60 nm) below the silver. The entire structure was exposed from above with a mercury lamp. Feature sizes as small as 250 nm (at a 500 nm period) were imaged, demonstrating the lensing ability of the planar silver slab. (C) 2004 American Vacuum Society.
引用
收藏
页码:3470 / 3474
页数:5
相关论文
共 14 条
[1]   Sub-diffraction-limited patterning using evanescent near-field optical lithography [J].
Alkaisi, MM ;
Blaikie, RJ ;
McNab, SJ ;
Cheung, R ;
Cumming, DRS .
APPLIED PHYSICS LETTERS, 1999, 75 (22) :3560-3562
[2]  
Blaikie RJ, 2002, MICROELECTRON ENG, V61-2, P97, DOI 10.1016/S0167-9317(02)00421-5
[3]   Imaging properties of a metamaterial superlens [J].
Fang, N ;
Zhang, X .
APPLIED PHYSICS LETTERS, 2003, 82 (02) :161-163
[4]   Refraction in media with a negative refractive index [J].
Foteinopoulou, S ;
Economou, EN ;
Soukoulis, CM .
PHYSICAL REVIEW LETTERS, 2003, 90 (10) :4
[5]   Patterning Sub-50 nm features with near-field embedded-amplitude masks [J].
Goodberlet, JG ;
Kavak, H .
APPLIED PHYSICS LETTERS, 2002, 81 (07) :1315-1317
[6]   OPTICAL CONSTANTS OF NOBLE METALS [J].
JOHNSON, PB ;
CHRISTY, RW .
PHYSICAL REVIEW B, 1972, 6 (12) :4370-4379
[7]   Contrast in the evanescent near field of λ/20 period gratings for photolithography [J].
McNab, SJ ;
Blaikie, RJ .
APPLIED OPTICS, 2000, 39 (01) :20-25
[8]   Submicron imaging with a planar silver lens [J].
Melville, DOS ;
Blaikie, RJ ;
Wolf, CR .
APPLIED PHYSICS LETTERS, 2004, 84 (22) :4403-4405
[9]   Negative refraction makes a perfect lens [J].
Pendry, JB .
PHYSICAL REVIEW LETTERS, 2000, 85 (18) :3966-3969
[10]   Subwavelength imaging by a left-handed material superlens [J].
Rao, XS ;
Ong, CK .
PHYSICAL REVIEW E, 2003, 68 (06)