A simple error correction method for two-port transmission parameter measurement

被引：28

作者：

Wan, CH ^{[1
]}

Nauwelaers, B

De Raedt, W

机构：

[1] Univ Tromso, Dept Phys, N-9037 Tromso, Norway

[2] Katholieke Univ Leuven, Dept Elect Engn, B-3001 Heverlee, Belgium

[3] Interuniv Microelect Ctr, B-3001 Heverlee, Belgium

来源：

IEEE MICROWAVE AND GUIDED WAVE LETTERS | 1998年 / 8卷 / 02期

关键词：

calibration; scattering parameters measurement;

D O I：

10.1109/75.658640

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This letter presents a simple error correction method for two-port transmission parameter measurement. The method requires measuring only two nonreflecting transmission lines instead of a complete set of calibration standards (at least three) for error correction, It does not need an explicit solution of error coefficients, These two features make it simpler than any other methods. Error-corrected measurement results of a CPW discontinuity using the new method and the TRL method are in good agreement. The new method is useful in characterizing well-matched two-port devices or those whose reflection parameters are of little interest.

引用

页码：58 / 59

页数：2

共 7 条

[1]

BACK KH, 1995, IEEE MICROW GUIDED W, V5, P3

[2] THRU-REFLECT-LINE - IMPROVED TECHNIQUE FOR CALIBRATING THE DUAL 6-PORT AUTOMATIC NETWORK ANALYZER [J].