A sinewave fitting procedure for characterizing data acquisition channels in the presence of time base distortion and time jitter

被引：27

作者：

Schoukens, J

Pintelon, R

Vandersteen, G

机构：

[1] Vrije Universiteit Brussel, Department of Electrical Measurement

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1997年 / 46卷 / 04期

关键词：

analog-digital conversion; harmonic distortion; timing jitter; time base distortion;

D O I：

10.1109/19.650817

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A method is proposed to characterize the nonideal behavior of a data acquisition channel using a sinewave fitting procedure. Three error sources are considered: the nonlinear (dynamic) behavior of the data acquisition channel (amplifiers, sample-and-hold, analog-digital convertor); the time base distortion; and the time jitter, These errors are quantified starting from a series of repeated sinewave measurements.

引用

页码：1005 / 1010

页数：6

共 7 条

[1] A/D CONVERTER CHARACTERIZATION BY SPECTRAL-ANALYSIS IN DUAL-TONE MODE [J].