A sinewave fitting procedure for characterizing data acquisition channels in the presence of time base distortion and time jitter

被引:27
作者
Schoukens, J
Pintelon, R
Vandersteen, G
机构
[1] Vrije Universiteit Brussel, Department of Electrical Measurement
关键词
analog-digital conversion; harmonic distortion; timing jitter; time base distortion;
D O I
10.1109/19.650817
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A method is proposed to characterize the nonideal behavior of a data acquisition channel using a sinewave fitting procedure. Three error sources are considered: the nonlinear (dynamic) behavior of the data acquisition channel (amplifiers, sample-and-hold, analog-digital convertor); the time base distortion; and the time jitter, These errors are quantified starting from a series of repeated sinewave measurements.
引用
收藏
页码:1005 / 1010
页数:6
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